X-RAY-LITHOGRAPHY 2-STATE ALIGNMENT SYSTEM

被引:7
作者
CHEN, G
CERRINA, F
WU, Z
机构
[1] UNIV WISCONSIN,DEPT ELECT & COMP ENGN,MADISON,WI 53706
[2] INST OPT & ELECTR,CHENDU,PEOPLES R CHINA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 06期
关键词
D O I
10.1116/1.584664
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1995 / 1999
页数:5
相关论文
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Born M., 1964, PRINCIPLES OPTICS
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CULLMANN E, 1987, SPIE, V773, P2
[3]  
FAY B, 1979, J VAC SCI TECHNOL, V16, P1954, DOI 10.1116/1.570364
[4]   NEW INTERFEROMETRIC ALIGNMENT TECHNIQUE [J].
FLANDERS, DC ;
SMITH, HI ;
AUSTIN, S .
APPLIED PHYSICS LETTERS, 1977, 31 (07) :426-428
[5]   AN X-RAY STEPPER FOR SYNCHROTRON RADIATION LITHOGRAPHY [J].
KOUNO, E ;
TANAKA, Y ;
IWATA, J ;
TASAKI, Y ;
KAKIMOTO, E ;
OKADA, K ;
SUZUKI, K ;
FUJII, K ;
NOMURA, E .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (06) :2135-2138
[6]  
KREUZER J, COMMUNICATION