QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY AND X-RAY-FLUORESCENCE ANALYSIS OF CO-SM ALLOY THIN-FILMS DEPOSITED BY CO-EVAPORATION

被引：4

作者：

ANTON, R ^{[1
]}

机构：

[1] UNIV HAMBURG,INST ANGEW PHYS,D-2000 HAMBURG 13,FED REP GER

来源：

THIN SOLID FILMS | 1981年 / 81卷 / 01期

关键词：

D O I：

10.1016/0040-6090(81)90504-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：53 / 60

页数：8

共 9 条

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CHO, AY .

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[3]

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[4]

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[5] EFFECT OF BACKSCATTERED ELECTRONS ON RESOLUTION OF SCANNING AUGER MICROSCOPY [J].

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VENABLES, JA .

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[6]

LEGRESSUS C, 1975, CR ACAD SCI B PHYS, V280, P439

[7] SCANNING AUGER-ELECTRON MICROSCOPY AT 30 NM RESOLUTION [J].

VENABLES, JA ;

JANSSEN, AP ;

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JOYCE, BA .

PHILOSOPHICAL MAGAZINE, 1976, 34 (03) :495-500

[8]

VENABLES JA, 1978, 9TH INT C EL MICR TO

[9]

WIEDMANN P, 1977, OPTIK, V49, P295

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