EFFECT OF BACKSCATTERED ELECTRONS ON RESOLUTION OF SCANNING AUGER MICROSCOPY

被引:34
作者
JANSSEN, AP
VENABLES, JA
机构
关键词
D O I
10.1016/0039-6028(78)90011-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:351 / 364
页数:14
相关论文
共 22 条
  • [1] DIGITAL SCANNING AUGER-ELECTRON MICROSCOPE INCORPORATING A CONCENTRIC HEMISPHERICAL ANALYZER
    BROWNING, R
    BASSETT, PJ
    ELGOMATI, MM
    PRUTTON, M
    [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1977, 357 (1689) : 213 - +
  • [2] CHRISTOU A, 1975, IITRISEM1975, P149
  • [3] NUCLEATION AND GROWTH IN SYSTEM AG-MO(100) - COMPARISON OF UHV-SEM AND AES-LEED OBSERVATIONS
    HARTIG, K
    JANSSEN, AP
    VENABLES, JA
    [J]. SURFACE SCIENCE, 1978, 74 (01) : 69 - 78
  • [4] DIRECT OBSERVATION OF GRAIN-BOUNDARY DIFFUSION BY SCANNING AUGER MICROSCOPY
    JANSSEN, AP
    VENABLES, JA
    HWANG, JCM
    BALLUFFI, RW
    [J]. PHILOSOPHICAL MAGAZINE, 1977, 36 (06): : 1537 - 1540
  • [5] RATIO TECHNIQUE FOR MICRO-AUGER ANALYSIS
    JANSSEN, AP
    HARLAND, CJ
    VENABLES, JA
    [J]. SURFACE SCIENCE, 1977, 62 (01) : 277 - 292
  • [6] JANSSEN AP, 1977, I PHYS C, P91
  • [7] INFLUENCE OF BACKSCATTERED ELECTRONS ON LATERAL RESOLUTION IN SCANNING AUGER MICROSCOPY
    KIRSCHNER, J
    [J]. APPLIED PHYSICS, 1977, 14 (04): : 351 - 354
  • [8] LEGRESSUS C, 1975, CR ACAD SCI B PHYS, V280, P439
  • [9] SIMPLE MONTE-CARLO METHOD FOR SIMULATING ELECTRON-SOLID INTERACTIONS AND ITS APPLICATION TO ELECTRON-PROBE MICROANALYSIS
    LOVE, G
    COX, MGC
    SCOTT, VD
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (01) : 7 - 23
  • [10] MCDONALD NC, 1971, IITRI SCANNING ELECT, P89