EFFECT OF BACKSCATTERED ELECTRONS ON RESOLUTION OF SCANNING AUGER MICROSCOPY

[11] ANGULAR-DEPENDENCE OF AUGER-ELECTRON EMISSION FROM CU(111) AND (100) SURFACES [J]. SURFACE SCIENCE, 1975, 51 (01) : 249 - 269

[12] SPATIAL DISTRIBUTION OF BACKSCATTERED ELECTRONS IN SCANNING ELECTRON-MICROSCOPE AND ELECTRON-MICROPROBE [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (09) : 4110 - 4117

[13] MURATA K, 1976, PHYS STATUS SOLIDI A, V36, P197, DOI 10.1002/pssa.2210360121

[14] MURATA K, 1973, IITRISEM1973, P267

[15] TEMPERATURE DISTRIBUTIONS IN THIN FOIL + SEMI-INFINITE TARGETS BOMBARDED BY ELECTRON BEAM [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (08): : 967 - &

[16] HIGH-SPATIAL RESOLUTION AUGER-SPECTROSCOPY AND AUGER INTEGRATION APPLICATIONS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 370 - 374

[17] QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY AND ELECTRON RANGES [J]. SURFACE SCIENCE, 1972, 32 (03) : 703 - &

[18] SEAH MP, 1973, IITRISEM1973, P276

[19] AUGER EMISSION FROM SOLIDS - ESTIMATION OF BACKSCATTERING EFFECTS AND IONIZATION CROSS-SECTIONS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (01) : 151 - 161

[20] AUGER-ELECTRON SPECTROSCOPY AT HIGH SPATIAL-RESOLUTION AND NA PRIMARY BEAM CURRENTS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (04): : 953 - 955

[11] ANGULAR-DEPENDENCE OF AUGER-ELECTRON EMISSION FROM CU(111) AND (100) SURFACES [J]. SURFACE SCIENCE, 1975, 51 (01) : 249 - 269

[12] SPATIAL DISTRIBUTION OF BACKSCATTERED ELECTRONS IN SCANNING ELECTRON-MICROSCOPE AND ELECTRON-MICROPROBE [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (09) : 4110 - 4117

[13] MURATA K, 1976, PHYS STATUS SOLIDI A, V36, P197, DOI 10.1002/pssa.2210360121

[14] MURATA K, 1973, IITRISEM1973, P267

[15] TEMPERATURE DISTRIBUTIONS IN THIN FOIL + SEMI-INFINITE TARGETS BOMBARDED BY ELECTRON BEAM [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1964, 15 (08): : 967 - &

[16] HIGH-SPATIAL RESOLUTION AUGER-SPECTROSCOPY AND AUGER INTEGRATION APPLICATIONS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 370 - 374

[17] QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY AND ELECTRON RANGES [J]. SURFACE SCIENCE, 1972, 32 (03) : 703 - &

[18] SEAH MP, 1973, IITRISEM1973, P276

[19] AUGER EMISSION FROM SOLIDS - ESTIMATION OF BACKSCATTERING EFFECTS AND IONIZATION CROSS-SECTIONS [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (01) : 151 - 161

[20] AUGER-ELECTRON SPECTROSCOPY AT HIGH SPATIAL-RESOLUTION AND NA PRIMARY BEAM CURRENTS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (04): : 953 - 955