THE G-VALUES OF DEFECTS IN AMORPHOUS C, SI AND GE

被引:50
作者
ISHII, N [1 ]
KUMEDA, M [1 ]
SHIMIZU, T [1 ]
机构
[1] KANAZAWA UNIV,DEPT ELECTR,KANAZAWA,ISHIKAWA 920,JAPAN
关键词
D O I
10.1143/JJAP.20.L673
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:L673 / L676
页数:4
相关论文
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