HIGH-RESOLUTION X-RAY-DIFFRACTION AND TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF INGAAS/INP SUPERLATTICES GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY

被引:34
作者
VANDENBERG, JM
CHU, SNG
HAMM, RA
PANISH, MB
TEMKIN, H
机构
关键词
D O I
10.1063/1.97393
中图分类号
O59 [应用物理学];
学科分类号
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页码:1302 / 1304
页数:3
相关论文
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