FAST INTERFACE-STATE LOSSES IN CHARGE-COUPLED DEVICES

[1] CHARGE-COUPLED IMAGING DEVICES - DESIGN CONSIDERATIONS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1971, ED18 (11) : 986 - +

[2] CHARGE COUPLED SEMICONDUCTOR DEVICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 587 - +

[3] CARNES JE, TO BE PUBLISHED

[4] ENGELER W, 1971, IEEE ELECTRON DEVICE

[5] Grove A S, 1967, PHYS TECHNOLOGY SEMI

[6] CHARGE-COUPLES DIGITAL CIRCUITS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1971, SC 6 (05) : 314 - +

[7] KOSONOCKY WF, 1971, IEEE J SOLID-ST CIRC, VSC6, P5

[8] KOSONOCKY WF, 1972, 1972 INT SOL STAT CI

[9] NICOLLIAN EH, 1967, BELL SYST TECH J, V46, P1095

[10] STRAIN RS, 1970, IEEE ELECTRON DEVICE

[1] CHARGE-COUPLED IMAGING DEVICES - DESIGN CONSIDERATIONS [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1971, ED18 (11) : 986 - +

[2] CHARGE COUPLED SEMICONDUCTOR DEVICES [J]. BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (04): : 587 - +

[3] CARNES JE, TO BE PUBLISHED

[4] ENGELER W, 1971, IEEE ELECTRON DEVICE

[5] Grove A S, 1967, PHYS TECHNOLOGY SEMI

[6] CHARGE-COUPLES DIGITAL CIRCUITS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1971, SC 6 (05) : 314 - +

[7] KOSONOCKY WF, 1971, IEEE J SOLID-ST CIRC, VSC6, P5

[8] KOSONOCKY WF, 1972, 1972 INT SOL STAT CI

[9] NICOLLIAN EH, 1967, BELL SYST TECH J, V46, P1095

[10] STRAIN RS, 1970, IEEE ELECTRON DEVICE