DETERMINATION OF BORON AND LITHIUM IN NUCLEAR-MATERIALS BY SECONDARY ION MASS-SPECTROMETRY

被引：21

作者：

CHRISTIE, WH

EBY, RE

WARMACK, RJ

LANDAU, L

机构：

来源：

ANALYTICAL CHEMISTRY | 1981年 / 53卷 / 01期

关键词：

D O I：

10.1021/ac00224a006

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

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页码：13 / 17

页数：5

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共 12 条

[1] ION MICROPROBE MASS ANALYZER
ANDERSEN, CA
HINTHORNE, JR
[J]. SCIENCE, 1972, 175 (4024) : 853 - +
[2] NEGATIVE ION BOMBARDMENT OF INSULATORS TO ALLEVIATE SURFACE CHARGE-UP
ANDERSEN, CA
RODEN, HJ
ROBINSON, CF
[J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (08) : 3419 - +
[3] BLAKE EM, 1979, NUCLEAR NEWS, V22, P32
[4] DETERMINATION OF BORON IN GLASS BY DIRECT-CURRENT PLASMA EMISSION SPECTROMETRY
BURDO, RA
SNYDER, ML
[J]. ANALYTICAL CHEMISTRY, 1979, 51 (09) : 1502 - 1508
[5] COLLINS TL, 1966, ADV MASS SPECTROM, V3, P169
[6] ION MICROPROBE MASS ANALYZER
LIEBL, H
[J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (13) : 5277 - &
[7] HYDROGEN-ION IMPLANTATION PROFILES AS DETERMINED BY SIMS
MAGEE, CW
WU, CP
[J]. NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3): : 529 - 533
[8] ELEMENTAL ANALYSIS OF SINGLE MICROMETER-SIZE AIRBORNE PARTICULATES BY ION MICROPROBE MASS-SPECTROMETRY
MCHUGH, JA
STEVENS, JF
[J]. ANALYTICAL CHEMISTRY, 1972, 44 (13) : 2187 - &
[9] MCHUGH JA, 1976, METHODS PHENOMENA
[10] TEST OF A QUANTITATIVE APPROACH TO SECONDARY ION MASS-SPECTROMETRY ON GLASS AND SILICATE STANDARDS
MORGAN, AE
WERNER, HW
[J]. ANALYTICAL CHEMISTRY, 1977, 49 (07) : 927 - 931