DYNAMICS OF THE DISSOCIATIVE ADSORPTION OF DISILANE ON SI(100) - ENERGY SCALING AND THE EFFECT OF CORRUGATION

被引:44
作者
ENGSTROM, JR
HANSEN, DA
FURJANIC, MJ
XIA, LQ
机构
[1] School of Chemical Engineering, Cornell University, Ithaca
关键词
D O I
10.1063/1.466228
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The reaction of Si2H6 with the Si(100) surface has been examined via supersonic molecular beam scattering techniques. It is found that the reaction probability is most sensitive to the incident translational energy, varying nearly linearly with increasing energy for [E(tr)] > 1 eV. The effect of incident angle theta(i) is described by a model that accounts explicitly for surface corrugation and assumes that the reaction probability varies with [E(tr)] cos2 theta(loc), where theta(loc) is the incident angle with respect to the local surface normal.
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页码:4051 / 4054
页数:4
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