TRANSIENT INTENSITY NOISE OF SEMICONDUCTOR-LASERS - EXPERIMENTS AND COMPARISON WITH THEORY

被引：10

作者：

CZYLWIK, A

EBERLE, W

机构：

[1] Technische Hochschule Darmstadt, Institut für Übertragungstechnik, 6100 Darmstadt

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1990年 / 26卷 / 02期

关键词：

D O I：

10.1109/3.44953

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An experimental setup for the measurement of the nonstationary intensity fluctuations during the turn-on transient of semiconductor lasers is presented. Measurements are carried out and compared with simulations, which are based on rate equations with Langevin fluctuation functions. A good agreement between theory and measurements is found and it is confirmed that the nonstationary intensity noise can be interpreted as timing jitter. © 1990 IEEE

引用

页码：225 / 230

页数：6

共 7 条

[1] 3-LAYER AND 4-LAYER LPE INGAAS(P) MUSHROOM STRIPE LASERS FOR LAMBDA = 130, 154, AND 166-MUM [J].