NATIVE DEFECTS IN III-V-TERNARY ALLOY SEMICONDUCTORS GROWN FROM LIQUID-SOLUTIONS

被引:7
作者
ICHIMURA, M
WADA, T
机构
[1] Department of Electrical and Computer Engineering, Nagoya Institute of Technology, Nagoya, 466, Gokiso
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1990年 / 29卷 / 08期
关键词
Alloy; Antisite; Native defect; Point defect; Semiconductor; Thermodynamic model; Vacancy;
D O I
10.1143/JJAP.29.1515
中图分类号
O59 [应用物理学];
学科分类号
摘要
A thermodynamic model of native defects developed by Van Vechten was extended and applied to III–V ternary alloy semiconductors grown from a liquid solution. Antisites and vacancies were taken to be dominant defects. In order to guarantee the solvability of the mass action equations, the equilibrium of defect-formation reactions and the liquid-solid phase equilibrium were considered with consistency; that is, the same thermodynamic data were used in calculations of the phase diagrams and the defect concentrations. In addition, the effects of the nonideality of the alloy were taken into account in the calculation of the free energies of the reactions. The Al-composition dependence and temperature dependence of the native defect concentrations in Ga1-xAlxAs were calculated as an example. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:1515 / 1520
页数:6
相关论文
共 24 条
[1]   GALLIUM ARSENITIDE OF HIGH MOBILITY OBTAINED BY EPITAXY IN LIQUID PHASE [J].
ANDRE, E ;
LEDUC, JM .
MATERIALS RESEARCH BULLETIN, 1968, 3 (01) :1-&
[2]   SHORT-RANGE ORDER AND CLUSTERING IN GA1-XALXAS AND ITS HETEROSTRUCTURES [J].
BALZAROTTI, A ;
LETARDI, P ;
MOTTA, N .
SOLID STATE COMMUNICATIONS, 1985, 56 (06) :471-473
[3]   ELECTRONIC-STRUCTURE, TOTAL ENERGIES, AND ABUNDANCES OF THE ELEMENTARY POINT-DEFECTS IN GAAS [J].
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW LETTERS, 1985, 55 (12) :1327-1330
[4]   NATIVE DEFECTS AND STOICHIOMETRY IN GAALAS [J].
BLOM, GM .
JOURNAL OF CRYSTAL GROWTH, 1976, 36 (01) :125-137
[5]   EFFECT OF ISO-ELECTRONIC DOPANTS ON THE DISLOCATION DENSITY OF GAAS [J].
BLOM, GM ;
WOODALL, JM .
JOURNAL OF ELECTRONIC MATERIALS, 1988, 17 (05) :391-396
[6]  
BOURGOIN J, 1983, POINT DEFECTS SEMICO, V2
[7]   MIXING ENTHALPY AND COMPOSITION FLUCTUATIONS IN TERNARY-III-V SEMICONDUCTOR ALLOYS [J].
FEDDERS, PA ;
MULLER, MW .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1984, 45 (06) :685-688
[8]   COMPENSATION IN GAAS CRYSTALS DUE TO ANTI-STRUCTURE DISORDER [J].
FIGIELSKI, T .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1984, 35 (04) :255-261
[9]  
FUKUI T, 1985, J APPL PHYS, V50, P5188
[10]   COMPENSATION MECHANISM IN LIQUID ENCAPSULATED CZOCHRALSKI GAAS - IMPORTANCE OF MELT STOICHIOMETRY [J].
HOLMES, DE ;
CHEN, RT ;
ELLIOTT, KR ;
YU, PW .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1982, 30 (07) :949-955