ELECTRON-MICROSCOPY CHARACTERIZATION OF AU/NI CONTACTS TO P-TYPE INP

被引:10
作者
IVEY, DG
BRUCE, R
PIERCY, GR
机构
[1] BELL NO RES,STN C,OTTAWA K1Y 4H7,ONTARIO,CANADA
[2] MCMASTER UNIV,DEPT MAT SCI & ENGN,HAMILTON L8S 4L8,ONTARIO,CANADA
关键词
D O I
10.1007/BF02652121
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:373 / 380
页数:8
相关论文
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