INVESTIGATION OF MINORITY-CARRIER DIFFUSION LENGTHS BY MEANS OF THE SCANNING ELECTRON MICRO-PROBE (SEM)

被引：31

作者：

OELGART, G

FIDDICKE, J

REULKE, R

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 66卷 / 01期

关键词：

D O I：

10.1002/pssa.2210660135

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：283 / 292

页数：10

共 23 条

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[3]

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[9] DIRECT MEASUREMENT OF VERY SHORT MINORITY-CARRIER DIFFUSION LENGTHS IN SEMICONDUCTORS [J].

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[10] SCANNING ELECTRON-MICROSCOPE CHARACTERIZATION OF GAP RED-EMITTING DIODES [J].

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