RADIATION-DAMAGE TEST OF SILICON MULTISTRIP DETECTORS

被引：22

作者：

NAKAMURA, M ^{[1
]}

TOMITA, Y ^{[1
]}

NIWA, K ^{[1
]}

KONDO, T ^{[1
]}

机构：

[1] KEK,NATL LAB HIGH ENERGY PHYS,IBARAKI 304,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1988年 / 270卷 / 01期

关键词：

D O I：

10.1016/0168-9002(88)90007-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：42 / 55

页数：14

共 25 条

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[2] THE EFFECT OF RADIATION ON THE ENERGY RESOLUTION OF ION-IMPLANTED SILICON DETECTORS
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 211 (2-3): : 363 - 367
[3] RADIATION-DAMAGE IN SILICON STRIP DETECTORS
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 253 (03) : 460 - 466
[4] CAPACITATIVE CHARGE DIVISION READOUT WITH A SILICON STRIP DETECTOR
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 185 (1-3): : 43 - 47
[5] DEVELOPMENT OF LARGE AREA SILICON DETECTORS - SPECIAL PROPERTIES AND RADIATION STABILITY
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GRUBE, R
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NAGEL, J
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1987, 253 (03) : 467 - 477
[6] Grove A S, 1967, PHYS TECHNOLOGY SEMI
[7] HEIJNE EHM, 1983, CERN8306 REP
[8] Hughes HL., 1964, ELECTRONICS, V37, P58
[9] A SILICON COUNTER TELESCOPE TO STUDY SHORT-LIVED PARTICLES IN HIGH-ENERGY HADRONIC-INTERACTIONS
HYAMS, B
KOETZ, U
BELAU, E
KLANNER, R
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 205 (1-2): : 99 - 105
[10] KONDO T, 1984, JUN DES UT SUP SUP C, P613

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