HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDIES OF THE MICROSTRUCTURE IN C49-TISI2 CRYSTALS

被引：12

作者：

JIA, CL

JIANG, J

ZONG, XF

机构：

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1989年 / 59卷 / 05期

关键词：

D O I：

10.1080/01418618908209833

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：999 / 1012

页数：14

共 6 条

[1] METASTABLE PHASE FORMATION IN TITANIUM-SILICON THIN-FILMS [J].

BEYERS, R ;

SINCLAIR, R .

[2]

CHU YM, 1987, 2ND P BEIJ C EXH INS, P169

[3]

Cotter P.G., 1956, J AM CERAM SOC, V39, P11

[4] LOCALIZED EPITAXIAL-GROWTH OF C54 AND C49 TISI2 ON (111)SI [J].

FUNG, MS ;

CHENG, HC ;

CHEN, LJ .

GUO, YX ;

HEI, ZK ;

WU, YK ;

KUO, KH .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1985, 52 (04) :869-880

RAAIJMAKERS, IJMM ;

READER, AH ;

VANHOUTUM, HJW .