MEASUREMENT OF ABSOLUTE AL CONCENTRATION IN ALXGA1-XAS

被引：11

作者：

YAN, D ^{[1
]}

FARRELL, JP ^{[1
]}

LESSER, PMS ^{[1
]}

POLLAK, FH ^{[1
]}

KUECH, TF ^{[1
]}

WOLFORD, DJ ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1987年 / 24-5卷

关键词：

D O I：

10.1016/S0168-583X(87)80220-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：662 / 666

页数：5

共 17 条

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[6]

Chu W. K., 1978, BACKSCATTERING SPECT

[7] PREPARATION AND PROPERTIES OF GA1-XALXAS-GAAS HETEROSTRUCTURE LASERS GROWN BY METAL-ORGANIC CHEMICAL VAPOR-DEPOSITION [J].

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[8]

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[9] 26-PERCENT EFFICIENT MAGNESIUM-DOPED ALGAAS/GAAS SOLAR CONCENTRATOR CELLS [J].

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[10]

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