SYSTEMATIC-ERRORS IN DIGITAL CROSS CORRELATORS DUE TO QUANTIZATION AND DIFFERENTIAL NONLINEARITY

被引：14

作者：

WHITE, DR ^{[1
]}

PICKUP, CP ^{[1
]}

机构：

[1] CSIRO,DIV APPL PHYS,NATL STAND LAB,LINDFIELD,NSW 2070,AUSTRALIA

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1987年 / 36卷 / 01期

关键词：

D O I：

10.1109/TIM.1987.6312629

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：47 / 53

页数：7

共 14 条

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[2]

BRIGHAM O, 1974, FAST FOURIER TRANSFO

[3] USE OF RANDOM NOISE TO IMPROVE RESOLUTION IN ANALOGUE-TO-DIGITAL VOLTAGE CONVERSION [J].

BUTTERWORTH, J ;

MACLAUGHLIN, DE ;

MOSS, BC .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (12) :1029-+

[4] ERROR PATTERNS IN CORRELATORS WITH 4-LEVEL QUANTIZATION [J].

EGAU, PC .

IEE PROCEEDINGS-F RADAR AND SIGNAL PROCESSING, 1984, 131 (01) :40-46

[5]

Grobner W., 1973, INTEGRALTAFEL ZWEITE

[6]

Klempt G, 1982, TEMP ITS MEAS, V5, P125

[7]

PICKUP CP, 1983, P C NOISE PHYSICAL S, P409

[8]

SHEINGOLD DM, 1977, ANALOGUE DIGITAL CON

[9] AUTOMATED TEST SET FOR HIGH-RESOLUTION ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERTERS [J].

SOUDERS, TM ;

FLACH, DR .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1979, 28 (04) :239-249

[10] A DYNAMIC TEST METHOD FOR HIGH-RESOLUTION A D CONVERTERS [J].

SOUDERS, TM .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1982, 31 (01) :3-5

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