PERFORMANCE OF A SCANNING FORCE MICROSCOPE USING A LASER DIODE

被引：18

作者：

SARID, D

IAMS, DA

INGLE, JT

WEISSENBERGER, V

PLOETZ, J

机构：

[1] Optical Sciences Center, University of Arizona, Tucson

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.576400

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We demonstrate a scanning force microscope using a laser diode with a sensitivity of 3 pm per ^Hz in the vertical direction. The system, which contains no optical elements other than the laser diode and its integrated photodiode, is currently used to image magnetic domains. © 1990, American Vacuum Society. All rights reserved.

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页码：378 / 382

页数：5

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