OPTICAL MONITORING OF NON-QUARTERWAVE MULTILAYER FILTERS

被引:65
作者
VIDAL, B
FORNIER, A
PELLETIER, E
机构
关键词
D O I
10.1364/AO.17.001038
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
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页码:1038 / 1047
页数:10
相关论文
共 12 条
[1]  
ABELES F, 1958, J PHYS-PARIS, V19, P327
[2]   SYNTHESIS OF DIELECTRIC STACKS WITH PRESCRIBED OPTICAL-PROPERTIES BY A FOURIER-TRANSFORM METHOD [J].
BORGOGNO, JP ;
PELLETIER, E .
THIN SOLID FILMS, 1976, 34 (02) :357-361
[3]  
BORGOGNO JP, UNPUBLISHED
[4]   OPTICAL FILTERS - MONITORING PROCESS ALLOWING AUTO-CORRECTION OF THICKNESS ERRORS [J].
BOUSQUET, P ;
FORNIER, A ;
KOWALCZYK, R ;
PELLETIER, E ;
ROCHE, P .
THIN SOLID FILMS, 1972, 13 (02) :285-290
[5]  
FORNIER A, UNPUBLISHED
[6]  
Giacomo P., 1952, J PHYS-PARIS, V13, p59A
[7]   ERROR COMPENSATION MECHANISMS IN SOME THIN-FILM MONITORING SYSTEMS [J].
MACLEOD, HA ;
PELLETIER, E .
OPTICA ACTA, 1977, 24 (09) :907-930
[8]   TURNING VALUE MONITORING OF NARROW-BAND ALL-DIELECTRIC THIN-FILM OPTICAL FILTERS [J].
MACLEOD, HA .
OPTICA ACTA, 1972, 19 (01) :1-&
[9]   AUTOMATIC EVALUATION OF OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS - APPLICATION TO THIN DIELECTRIC LAYERS [J].
PELLETIER, E ;
ROCHE, P ;
VIDAL, B .
NOUVELLE REVUE D OPTIQUE, 1976, 7 (06) :353-362
[10]  
PELLETIER E, 1972, NOUV REV OPTIQUE APP, V3, P133