SCATTERING IN AN AMORPHOUS LAYER MEASURED BY DECHANNELING

[11] GRASSO F, 1973, CHANNELING SOLIDS

[12] LINDHARD J, 1965, K DAN VIDENSK SE MFM, V34

[13] LUGUJJO E, UNPUBLISHED

[14] MAYER JW, 1970, ION IMPLANTATION SEM, pCH3

[15] PLURAL AND MULTIPLE SCATTERING OF LOW-ENERGY HEAVY PARTICLES IN SOLIDS [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 44 (01): : 253 - &

[16] CHANNELING-EFFECT ANALYSIS OF THIN FILMS ON SILICON - ALUMINUM OXIDE [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (11) : 4378 - +

[17] PICRAUX ST, 1972, APPL PHYS LETT, V20, P91, DOI 10.1063/1.1654061

[18] CHANNELING IN SI OVERLAID WITH AL AND AU FILMS [J]. PHYSICAL REVIEW B, 1972, 6 (03): : 718 - &

[19] Westmoreland J. E., 1970, Radiation Effects, V6, P161, DOI 10.1080/00337577008236293

[20] WESTMORELAND JW, 1971, THESIS CALIFORNIA I

[11] GRASSO F, 1973, CHANNELING SOLIDS

[12] LINDHARD J, 1965, K DAN VIDENSK SE MFM, V34

[13] LUGUJJO E, UNPUBLISHED

[14] MAYER JW, 1970, ION IMPLANTATION SEM, pCH3

[15] PLURAL AND MULTIPLE SCATTERING OF LOW-ENERGY HEAVY PARTICLES IN SOLIDS [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1971, 44 (01): : 253 - &

[16] CHANNELING-EFFECT ANALYSIS OF THIN FILMS ON SILICON - ALUMINUM OXIDE [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (11) : 4378 - +

[17] PICRAUX ST, 1972, APPL PHYS LETT, V20, P91, DOI 10.1063/1.1654061

[18] CHANNELING IN SI OVERLAID WITH AL AND AU FILMS [J]. PHYSICAL REVIEW B, 1972, 6 (03): : 718 - &

[19] Westmoreland J. E., 1970, Radiation Effects, V6, P161, DOI 10.1080/00337577008236293

[20] WESTMORELAND JW, 1971, THESIS CALIFORNIA I