DETERMINATION OF DEPTH PROFILES BY ANGULAR DEPENDENT X-RAY PHOTOELECTRON-SPECTRA

被引：38

作者：

IWASAKI, H

NISHITANI, R

NAKAMURA, S

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1978年 / 17卷 / 09期

关键词：

D O I：

10.1143/JJAP.17.1519

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1519 / 1523

页数：5

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