共 33 条
[11]
Lencova B., 1986, Scanning Electron Microscopy, P897
[12]
LENCOVA B, 1984, OPTIK, V68, P37
[14]
LIU H, 1990, OPTIK, V84, P123
[15]
ASYMMETRY ABERRATIONS AND TOLERANCING OF COMPLETE SYSTEMS OF ELECTRON LENSES AND DEFLECTORS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1990, 8 (06)
:1676-1681
[17]
MUNRO E, 1982, OPTIK, V61, P1
[18]
MUNRO E, 1982, OPTIK, V60, P371
[19]
FINITE-DIFFERENCE PROGRAMS FOR COMPUTING TOLERANCES FOR ELECTROSTATIC LENSES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1988, 6 (03)
:941-948
[20]
HIGH-RESOLUTION, LOW-ENERGY BEAMS BY MEANS OF MIRROR OPTICS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1988, 6 (06)
:1971-1976