LASER AND LED RELIABILITY UPDATE

被引：26

作者：

FUKUDA, M

机构：

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 1988年 / 6卷 / 10期

关键词：

D O I：

10.1109/50.7906

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1488 / 1495

页数：8

共 40 条

[1]

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[8] SUPPRESSION OF INTERFACE DEGRADATION IN INGAASP/INP BURIED HETEROSTRUCTURE LASERS [J].

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[9] FAILURE MODES OF INGAASP/INP LASERS DUE TO ADHESIVES [J].

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