ATOMIC-NUMBER AND CRYSTALLOGRAPHIC CONTRAST IMAGES WITH THE SEM - A REVIEW OF BACKSCATTERED ELECTRON TECHNIQUES

[1] THE MEASUREMENT OF ATOMIC-NUMBER AND COMPOSITION IN AN SEM USING BACKSCATTERED DETECTORS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1981, 124 (OCT): : 57 - 68

[2] BISHOP HE, 1966, 4TH ICXOM ORS, P153

[3] BISHOP HE, 1974, QUANTITATIVE SCANNIN, P41

[4] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1185 - &

[5] DEFORMATION OF CHROMITE - SEM INVESTIGATIONS [J]. TECTONOPHYSICS, 1986, 121 (2-4) : 175 - 196

[6] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1179 - &

[7] MULTIPLE SCATTERING OF 5-30 KEV ELECTRONS IN EVAPORATED METAL FILMS 3 - BACKSCATTERING AND ABSORPTION [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (06): : 779 - &

[8] THE STUDY OF LOCAL PLASTIC STRAIN IN NICKEL-BASED SUPER-ALLOYS BY SELECTED AREA CHANNELING PATTERNS IN THE STEM [J]. METALLOGRAPHY, 1980, 13 (03): : 225 - 234

[9] Davidson D. L., 1976, Journal of Physics E (Scientific Instruments), V9, P341, DOI 10.1088/0022-3735/9/5/007

[10] THE EFFECT OF DEFORMATION ON SELECTED AREA ELECTRON CHANNELING PATTERNS [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1982, 1 (06) : 236 - 238

[1] THE MEASUREMENT OF ATOMIC-NUMBER AND COMPOSITION IN AN SEM USING BACKSCATTERED DETECTORS [J]. JOURNAL OF MICROSCOPY-OXFORD, 1981, 124 (OCT): : 57 - 68

[2] BISHOP HE, 1966, 4TH ICXOM ORS, P153

[3] BISHOP HE, 1974, QUANTITATIVE SCANNIN, P41

[4] SOME COMMENTS ON INTERPRETATION OF KIKUCHI-LIKE REFLECTION PATTERNS OBSERVED BY SCANNING ELEECTRON MICROSCOPY [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1185 - &

[5] DEFORMATION OF CHROMITE - SEM INVESTIGATIONS [J]. TECTONOPHYSICS, 1986, 121 (2-4) : 175 - 196

[6] KIKUCHI-LIKE REFLECTION PATTERNS OBTAINED WITH SCANNING ELECTRON MICROSCOPE [J]. PHILOSOPHICAL MAGAZINE, 1967, 16 (144): : 1179 - &

[7] MULTIPLE SCATTERING OF 5-30 KEV ELECTRONS IN EVAPORATED METAL FILMS 3 - BACKSCATTERING AND ABSORPTION [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1965, 16 (06): : 779 - &

[8] THE STUDY OF LOCAL PLASTIC STRAIN IN NICKEL-BASED SUPER-ALLOYS BY SELECTED AREA CHANNELING PATTERNS IN THE STEM [J]. METALLOGRAPHY, 1980, 13 (03): : 225 - 234

[9] Davidson D. L., 1976, Journal of Physics E (Scientific Instruments), V9, P341, DOI 10.1088/0022-3735/9/5/007

[10] THE EFFECT OF DEFORMATION ON SELECTED AREA ELECTRON CHANNELING PATTERNS [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1982, 1 (06) : 236 - 238