PERSISTENT METALLIC BEHAVIOR OF THIN BISMUTH WHISKERS

被引：29

作者：

OVERCASH, DR

RATNAM, BA

SKOVE, MJ

STILLWELL, EP

机构：

来源：

PHYSICAL REVIEW LETTERS | 1980年 / 44卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.44.1348

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1348 / 1351

页数：4

共 13 条

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PHYSICAL REVIEW LETTERS, 1979, 42 (10) :673-676

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ANDERSON, PW ;

ABRAHAMS, E ;

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PHYSICAL REVIEW LETTERS, 1979, 43 (10) :718-720

[3] QUANTUM LOCALIZATION IN AMORPHOUS W-RE ALLOYS [J].

CHAUDHARI, P ;

HABERMEIER, HU .

PHYSICAL REVIEW LETTERS, 1980, 44 (01) :40-43

[4]

COOK JW, 1971, THESIS CLEMSON U

[5] NON-METALLIC CONDUCTION IN THIN METAL-FILMS AT LOW-TEMPERATURES [J].

DOLAN, GJ ;

OSHEROFF, DD .

PHYSICAL REVIEW LETTERS, 1979, 43 (10) :721-724

[6]

DOLAN GJ, 1979, B AM PHYS SOC, V24, P233

[7] ACCELERATED GROWTH OF TIN WHISKERS [J].

FISHER, RM ;

DARKEN, LS ;

CARROLL, KG .

ACTA METALLURGICA, 1954, 2 (03) :368-&

[8]

GARLAND JC, 1979, B AM PHYS SOC, V24, P280

[9] EXPERIMENTAL-STUDY OF ANDERSON LOCALIZATION IN THIN WIRES [J].

GIORDANO, N ;

GILSON, W ;

PROBER, DE .

PHYSICAL REVIEW LETTERS, 1979, 43 (10) :725-728

[10] MEASUREMENT OF ELECTRON MEAN FREE PATH USING A BENDING EFFECT [J].

STILLWELL, EP ;

SKOVE, MJ ;

OVERCASH, DR ;

GETTYS, WB .

PHYSIK DER KONDENSITERTEN MATERIE, 1969, 9 (1-2) :183-+

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