CHARACTERISTICS OF LI-DOPED AND CL-DOPED ZNTE GROWN BY MOLECULAR-BEAM EPITAXY

被引:12
作者
HISHIDA, Y
TODA, T
YAMAGUCHI, T
机构
[1] Semiconductor Research Center, Sanyo Electric Co., Ltd., Hirakata, Osaka, 573
关键词
D O I
10.1016/0022-0248(92)90782-E
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We found that the carrier concentration of Li-doped ZnTe, grown at growth temperature (T(g)) of 320-degrees-C, increased with rising the Li-cell temperature (T(Li)) below 220 and above 260-degrees-C, and decreased between 220 and 260-degrees-C. Both the acceptor and donor concentration of the T(Li) = 300-degrees-C sample were estimated to be smaller than those of the T(Li) = 220-degrees-C sample. We also found by PL spectra that only when the film was grown at T(Li) = 220-degrees-C, I1Li was replaced by an A(Li-Li) band. These properties above T(Li) = 220-degrees-C can be explained if we assume that the electrical activity of Li in ZnTe decreases drastically above T(Li) = 220-degrees-C. We also investigated the PL spectra of Cl-doped ZnTe. The VI-II ratio and T(g) dependence of PL spectra indicated that the films with better crystallinity were grown under Te-rich conditions above T(g) = 300-degrees-C.
引用
收藏
页码:396 / 399
页数:4
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