INTERPRETATION OF AES DEPTH PROFILES OF POROUS AL-ANODIC OXIDES

被引：45

作者：

SUN, TS

MCNAMARA, DK

AHEARN, JS

CHEN, JM

DITCHEK, B

VENABLES, JD

机构：

来源：

关键词：

D O I：

10.1016/0378-5963(80)90105-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：406 / 425

页数：20

共 28 条

[1] STUDY OF BARRIER FILM GROWTH ON ALUMINUM IN SOLUTIONS OF FILM-PROMOTING AND AGGRESSIVE IONS USING SECONDARY ION MASS-SPECTROMETRY
ABDRABBO, MF
RICHARDSON, JA
WOOD, GC
[J]. CORROSION SCIENCE, 1976, 16 (10) : 689 - 702
[2] AHEARN JS, UNPUBLISHED
[3] USE OF AUGER SPECTROMETRY TO CHARACTERIZE ANODIC FILMS FORMED ON ALUMINUM
BADOR, R
BOUYSSOUX, G
ROMAND, M
SOLOMON, JS
BAUN, WL
[J]. MATERIALS RESEARCH BULLETIN, 1977, 12 (02) : 197 - 204
[4] PREDICTION OF ION-BOMBARDED SURFACE TOPOGRAPHIES USING FRANKS KINEMATIC THEORY OF CRYSTAL DISSOLUTION
BARBER, DJ
FRANK, FC
MOSS, M
STEEDS, JW
TSONG, IST
[J]. JOURNAL OF MATERIALS SCIENCE, 1973, 8 (07) : 1030 - 1040
[5] EXPERIMENTAL INVESTIGATION OF CYLINDRICAL MIRROR ANALYZER WITH 2PI-THERMIONIC ELECTRON SOURCE
BAS, EB
BANNINGE.U
KELLER, P
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01): : 306 - &
[6] BAUN WL, 1976, STP596 ASTM AM SOC T, P86
[7] Coburn J. W., 1974, Critical Reviews in Solid State Sciences, V4, P561, DOI 10.1080/10408437308245843
[8] SPUTTERING IN SURFACE ANALYSIS OF SOLIDS - DISCUSSION OF SOME PROBLEMS
COBURN, JW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (05): : 1037 - 1044
[9] DAVIS LE, 1976, HDB AUGER ELECTRON S, P55
[10] AUGER STUDY OF PHOSPHORUS AND PHOSPHORUS-COMPOUNDS ON A COPPER SURFACE
FERRER, S
BARO, AM
ROJO, JM
[J]. SURFACE SCIENCE, 1978, 72 (02) : 433 - 443