ELLIPSOMETER STUDY OF ANODIC OXIDES FORMED ON SPUTTERED TANTALUM AND TANTALUM-ALUMINUM ALLOY FILMS

被引:35
作者
MUTH, DG
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1969年 / 6卷 / 04期
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D O I
10.1116/1.1315750
中图分类号
O59 [应用物理学];
学科分类号
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页码:749 / &
相关论文
共 10 条
[1]   OPTICAL CONSTANTS OF INCANDESCENT REFRACTORY METALS [J].
BARNES, BT .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1966, 56 (11) :1546-&
[2]  
Drude P., 1890, PHYS CHEM, V39, P481, DOI [10.1002/andp.18902750402, DOI 10.1002/ANDP.18902750402]
[3]  
Heavens O.S., 1955, OPTICAL PROPERTIES T, P156
[4]  
KLERER J, 1955, J ELECTROCHEM SOC, V112, P869
[5]   MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J].
MCCRACKIN, FL ;
PASSAGLIA, E ;
STROMBERG, RR ;
STEINBERG, HL .
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04) :363-+
[6]   IONIC CONDUCTIVITY DIELECTRIC CONSTANT AND OPTICAL PROPERTIES OF ANODIC OXIDE FILMS ON 2 TYPES OF SPUTTERED TANTALUM FILMS [J].
MILLS, D ;
YOUNG, L ;
ZOBEL, FGR .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) :1821-&
[7]   OPTICAL PROPERTIES OF SURFACE FILMS [J].
ROTHEN, A .
ANNALS OF THE NEW YORK ACADEMY OF SCIENCES, 1951, 53 (05) :1054-1063
[8]  
Vasicek A., 1960, OPTICS THIN FILMS
[9]  
YOUNG L, 1961, ANODIC OXIDE FILMS, P216
[10]  
YOUNG L, 1961, ANODIC OXIDE FILMS, P186