GROWTH OF EPITAXIAL GERMANIUM-SILICON HETEROSTRUCTURES BY CHEMICAL VAPOR-DEPOSITION

被引:82
作者
GREVE, DW
机构
[1] Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1993年 / 18卷 / 01期
关键词
D O I
10.1016/0921-5107(93)90110-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Germanium-silicon epitaxial layers are now being applied in a variety of heterojunction devices on silicon substrates. In this paper, I review the growth of these structures by chemical vapor deposition. While a wide variety of growth conditions have been used, there is a general trend toward low temperature processes where surface chemical reactions play a dominant role. The present understanding of the decomposition of various reactants is therefore reviewed, followed by a discussion of the implications for growth kinetics. The introduction of defects during growth will also be discussed. Finally a summary of recent device developments will be given.
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页码:22 / 51
页数:30
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