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THE TACKING CCD - A NEW CCD CONCEPT

被引：3
作者：
BAKKER, JGC
ESSER, LJM
PEEK, HL
SWEENEY, CJ
KOKSHOORN, AL
THEUWISSEN, AJP
机构：
[1] Philips Research Laboratories, 5600, JA Eindhoven
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1991年 / 38卷 / 05期
关键词：
D O I：
10.1109/16.78397
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The Tacking CCD is a new type of charge transport mechanism that is suitable for junction- as well as MOS-type CCD's. A specific form, the Trenched Tacking CCD (TTCCD), promises high pixel density and high charge handling capability per unit of surface area. The TTCCD structure is suitable for making new types of solid-state image sensors with increased light sensitivity and there is the possibility of incorporating a vertical overflow drain. First samples of the TTCCD have been realized and its functionality has been confirmed.
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页码：1193 / 1200
页数：8
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