ELECTRONIC-STRUCTURE OF COMPLEX DEFECTS IN SILICON - DIVACANCY AND SPLIT 100 INTERSTITIAL

被引:6
作者
KAUFFER, E
PECHEUR, P
GERL, M
机构
来源
REVUE DE PHYSIQUE APPLIQUEE | 1980年 / 15卷 / 04期
关键词
D O I
10.1051/rphysap:01980001504084900
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:849 / 852
页数:4
相关论文
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