CHARACTERIZATION OF CORROSION LAYERS ON ALUMINUM BY SHIFTS IN ALUMINUM AND OXYGEN X-RAY EMISSION BANDS

被引:5
作者
GIGL, PD
SAVANICK, GA
WHITE, EW
机构
关键词
D O I
10.1149/1.2407426
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:15 / &
相关论文
共 10 条
[1]   CLINOCHLORE - A VERSATILE NEW ANALYZING CRYSTAL FOR X-RAY REGION 5-27 OA [J].
BAUN, WL ;
WHITE, EW .
ANALYTICAL CHEMISTRY, 1969, 41 (06) :831-&
[2]  
BIRKHOFF RD, 1968, HANDBUCH PHYSIK, V34, P135
[3]  
CHUN HU, 1967, Z NATURFORSCH PT A, VA 22, P1401
[5]   THIN FILM CHARACTERIZATION BY ELECTRON MICROPROBE AND ELLIPSOMETRY - SIO2 FILMS ON SILICON [J].
KNAUSENB.WH ;
VEDAM, K ;
WHITE, EW ;
ZEIGLER, W .
APPLIED PHYSICS LETTERS, 1969, 14 (02) :43-&
[6]   The soft X-ray spectroscopy of solids II. Emission spectra from simple chemical compounds [J].
O'Bryan, HM ;
Skinner, HWB .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1940, 176 (A965) :0229-0262
[7]   ELECTRONIC BAND STRUCTURE OF SOLIDS BY X-RAY SPECTROSCOPY [J].
PARRATT, LG .
REVIEWS OF MODERN PHYSICS, 1959, 31 (03) :616-645
[8]  
TOMBOULIAN DH, 1957, HDB PHYSIK, V30, P246
[9]  
WHITE EW, 1969, AM MINERAL, V54, P931
[10]   USE OF X-RAY EMISSION SPECTROSCOPY IN CHARACTERIZATION OF THIN FILMS OF ALUMINUM OXIDES AND HYDROXIDES [J].
WHITE, EW ;
ROY, R .
MATERIALS RESEARCH BULLETIN, 1967, 2 (03) :395-&