RECONSTRUCTIONS AND PHASE-TRANSITIONS OF GE ON THE SI(111)7X7 SURFACE .1. STRUCTURAL-CHANGES

被引:39
作者
KAJIYAMA, K
TANISHIRO, Y
TAKAYANAGI, K
机构
[1] TOKYO INST TECHNOL,DEPT PHYS,MEGURO KU,TOKYO 152,JAPAN
[2] TOKYO INST TECHNOL,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN
关键词
D O I
10.1016/0039-6028(89)90333-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:38 / 46
页数:9
相关论文
共 14 条
  • [1] TUNNELING IMAGES OF THE 5X5 SURFACE RECONSTRUCTION ON GE-SI(111)
    BECKER, RS
    GOLOVCHENKO, JA
    SWARTZENTRUBER, BS
    [J]. PHYSICAL REVIEW B, 1985, 32 (12): : 8455 - 8457
  • [2] NEW ADATOM MODEL FOR SI(111) 7X7 AND SI(111)-GE 5X5 RECONSTRUCTED SURFACES
    CHADI, DJ
    [J]. PHYSICAL REVIEW B, 1984, 30 (08): : 4470 - 4480
  • [3] GEOMETRICAL STRUCTURES OF THE GE/SI(111) INTERFACE AND THE SI(111) (7X7) SURFACE
    DEV, BN
    MATERLIK, G
    GREY, F
    JOHNSON, RL
    CLAUSNITZER, M
    [J]. PHYSICAL REVIEW LETTERS, 1986, 57 (24) : 3058 - 3061
  • [4] GOSSMANN HJ, 1984, SURF SCI, V138, pL175, DOI 10.1016/0039-6028(84)90247-4
  • [5] RHEED STUDY ON THE GE/SI(111) AND SI/GE(111) SYSTEMS - REACTION OF GE WITH THE SI(111)(7X7) SURFACE
    ICHIKAWA, T
    INO, S
    [J]. SURFACE SCIENCE, 1984, 136 (2-3) : 267 - 284
  • [6] THIN EPITAXIAL GE-SI(111) FILMS - STUDY AND CONTROL OF MORPHOLOGY
    MAREE, PMJ
    NAKAGAWA, K
    MULDERS, FM
    VANDERVEEN, JF
    KAVANAGH, KL
    [J]. SURFACE SCIENCE, 1987, 191 (03) : 305 - 328
  • [7] STABILITY AND SURFACE-PROPERTIES OF GE-SI ALLOY-FILMS ON SI(111) SUBSTRATE
    MCRAE, EG
    MALIC, RA
    [J]. SURFACE SCIENCE, 1986, 165 (01) : 191 - 202
  • [8] MCRAE EG, 1984, SURF SCI, V146, pL540, DOI 10.1016/0039-6028(84)90217-6
  • [9] PHOTOEMISSION-STUDY OF SI(111)-GE(5X5) SURFACES
    MILLER, T
    HSIEH, TC
    CHIANG, TC
    [J]. PHYSICAL REVIEW B, 1986, 33 (10): : 6983 - 6989
  • [10] GROWTH AND SURFACE-STRUCTURE OF GE-SI ALLOY-FILMS ON SI(111)-(7X7)
    SEO, JM
    DOERING, DL
    BLACK, DS
    ROWE, JE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 894 - 896