RHEED STUDY ON THE GE/SI(111) AND SI/GE(111) SYSTEMS - REACTION OF GE WITH THE SI(111)(7X7) SURFACE

被引：77

作者：

ICHIKAWA, T ^{[1
]}

INO, S ^{[1
]}

机构：

[1] UNIV TOKYO,FAC SCI,DEPT PHYS,TOKYO 113,JAPAN

来源：

SURFACE SCIENCE | 1984年 / 136卷 / 2-3期

关键词：

D O I：

10.1016/0039-6028(84)90611-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：267 / 284

页数：18

相关论文

共 11 条

[1] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE
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[2] SEMICONDUCTOR SURFACES
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[3] HIGASHIYAMA K, UNPUB PHYS REV LETT
[4] STRUCTURAL STUDY OF SN-INDUCED SUPERSTRUCTURES ON GE(111) SURFACES BY RHEED
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[5] DIFFUSE-SCATTERING FROM GE(111) SURFACE AT HIGH-TEMPERATURE
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[6] SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES
INO, S
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (06) : 891 - 908
[7] AN INVESTIGATION OF THE SI(111) 7X7 SURFACE-STRUCTURE BY RHEED
INO, S
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (07) : 1277 - 1290
[8] CHEMICAL-ANALYSIS OF SURFACE BY FLUORESCENT X-RAY SPECTROSCOPY USING RHEED-SSD METHOD
INO, S
ICHIKAWA, T
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (08) : 1451 - 1457
[9] SI (111) 7X7 SURFACE-STRUCTURE - CALCULATIONS OF LEED INTENSITY AND COMPARISON WITH EXPERIMENT
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MARK, P
[J]. PHYSICAL REVIEW B, 1977, 16 (12): : 5415 - 5425
[10] PSEUDOMORPHIC STRUCTURE AT THE INTERFACE OF GE ON SI(111) STUDIED BY HIGH-ENERGY-ION SCATTERING
NARUSAWA, T
GIBSON, WM
[J]. PHYSICAL REVIEW LETTERS, 1981, 47 (20) : 1459 - 1462