IN-SITU MEASUREMENT OF ELECTRIC-FIELDS AT INDIVIDUAL GRAIN-BOUNDARIES IN TIO2

被引：13

作者：

BONNELL, DA

HUEY, B

CARROLL, D

机构：

[1] Department of Materials Science, University of Pennsylvania, Philadelphia

来源：

SOLID STATE IONICS | 1995年 / 75卷

基金：

美国国家科学基金会;

关键词：

ATOMIC FORCE MICROSCOPY (AFM); TITANIUM OXIDE; GRAIN BOUNDARY; ELECTRIC FIELDS;

D O I：

10.1016/0167-2738(94)00180-Z

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Scanning probe microscopies have been used to characterize the variations in local electric fields near individual grain boundaries in TiO2. In-situ measurements of electric field gradients across a grain boundary with a lateral in-plane applied bias were made with atomic force microscopy. The dependence of field variations near the boundaries on applied voltage has been quantified and compared with theory. The effects of measured enhancement due to variations in cantilever deflection are considered explicitly.

引用

页码：35 / 42

页数：8

共 17 条

[1] THERMAL FACETING OF THE RUTILE TIO2(001) SURFACE [J].