INVESTIGATION OF CATION-TRANSPORT PROCESSES DURING ANODIC-OXIDATION OF DUPLEX LAYERS OF TANTALUM ON NIOBIUM BY USE OF RUTHERFORD BACKSCATTERING AND NUCLEAR MICROANALYSIS

被引：46

作者：

PERRIERE, J

RIGO, S

SIEJKA, J

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1978年 / 125卷 / 09期

关键词：

D O I：

10.1149/1.2131713

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

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页码：1549 / 1557

页数：9

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共 32 条

[1] 7ICROANALYSIS BY DIRECT OBSERVATION OF NUCLEAR REACTIONS USING A 2 MEV VAN-DE-GRAAFF
AMSEL, G
NADAI, JP
DARTEMAR.E
DAVID, D
GIRARD, E
MOULIN, J
[J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (04): : 481 - &
[2] MECHANISM OF ANODIC OXIDATION
AMSEL, G
SAMUEL, D
[J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1962, 23 (DEC) : 1707 - &
[3] AMSEL G, NUCL I METHODS
[4] AMSEL G, UNPUBLISHED
[5] AMSEL G, 1975, MAY P EL SOC M TOR, P227
[6] CHARACTERIZATION OF SILICON METALLIZATION SYSTEMS USING ENERGETIC ION BACKSCATTERING
BORDERS, JA
PICRAUX, ST
[J]. PROCEEDINGS OF THE IEEE, 1974, 62 (09) : 1224 - 1231
[7] USE OF RUTHERFORD BACKSCATTERING TO STUDY BEHAVIOR OF ION-IMPLANTED ATOMS DURING ANODIC-OXIDATION OF ALUMINUM - AR, KR, XE, K, RB, CS, CL, BR, AND I
BROWN, F
MACKINTOSH, WD
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (08) : 1096 - 1102
[8] FILM-FORMATION OXYGEN YIELD IN ANODIC OXIDATION OF NIOBIUM
CHERKI, C
[J]. ELECTROCHIMICA ACTA, 1971, 16 (10) : 1727 - &
[9] PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS
CHU, WK
MAYER, JW
NICOLET, MA
BUCK, TM
AMSEL, G
EISEN, F
[J]. THIN SOLID FILMS, 1973, 17 (01) : 1 - 41
[10] MIGRATION OF METAL AND OXYGEN DURING ANODIC FILM FORMATION
DAVIES, JA
DOMEIJ, B
PRINGLE, JPS
BROWN, F
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1965, 112 (07) : 675 - &

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