AUTOMATED STRUCTURE FACTOR REFINEMENT FROM CONVERGENT-BEAM PATTERNS

被引:108
作者
ZUO, JM
SPENCE, JCH
机构
[1] Department of Physics, Arizona State University, Tempe
基金
美国国家科学基金会;
关键词
D O I
10.1016/0304-3991(91)90071-D
中图分类号
TH742 [显微镜];
学科分类号
摘要
An algorithm is described which automatically adjusts values of the low-order structure factors, crystal thickness and absorption coefficients for the best fit to experimental convergent-beam electron diffraction (CBED) patterns recorded in the systematics orientation. A fitting index is defined, by analogy with R factors used in neutron diffraction. A comparison of several least-squares optimization routines is made, and the "Simplex" method found to be most useful. An analysis of errors, background and noise is presented. Source-code listings of most of the program have been published elsewhere. This treats three-dimensional dynamical diffraction by the Bloch-wave method from non-centrosymmetric crystals with absorption. The use of perturbation methods for the final 33-beam refinement is found to reduce the computation time from 6 h to 30 min. An example of the use of the program is given. For MgO, we find U(200) = 0.05847 +/-0.00051 and U(400) = 0.02484 +/- 0.00028. This algorithm may be used to measure and study any of the parameters (such as atomic coordinates, bonding effects or Debye-Waller factors) on which crystal structure factors depend. Similar methods allow lattice parameters to be refined to an accuracy of approximately 0.05%.
引用
收藏
页码:185 / 196
页数:12
相关论文
共 43 条
[1]  
BEVINGTON PR, 1969, DATA REDUCTION ERROR, pCH10
[2]   ACCURATE STRUCTURE-FACTOR PHASE DETERMINATION BY ELECTRON-DIFFRACTION IN NONCENTROSYMMETRIC CRYSTALS - COMMENT [J].
BIRD, DM ;
JAMES, D ;
KING, QA .
PHYSICAL REVIEW LETTERS, 1989, 63 (10) :1118-1118
[3]   ABSORPTIVE FORM-FACTORS FOR HIGH-ENERGY ELECTRON-DIFFRACTION [J].
BIRD, DM ;
KING, QA .
ACTA CRYSTALLOGRAPHICA SECTION A, 1990, 46 :202-208
[4]   DIRECT MEASUREMENT OF CRYSTALLOGRAPHIC PHASE BY ELECTRON-DIFFRACTION [J].
BIRD, DM ;
JAMES, R ;
PRESTON, AR .
PHYSICAL REVIEW LETTERS, 1987, 59 (11) :1216-1219
[5]  
BUXTON BF, 1976, PHIL T R SOC, V281, P181
[6]  
COWLEY JM, 1947, P PHYS SOC LOND, V59, P283
[7]   TETRAGONAL AND MONOCLINIC FORMS OF GEXSI1-X EPITAXIAL LAYERS [J].
EAGLESHAM, DJ ;
MAHER, DM ;
FRASER, HL ;
HUMPHREYS, CJ ;
BEAN, JC .
APPLIED PHYSICS LETTERS, 1989, 54 (03) :222-224
[8]   A SUMMARY OF LOW-ANGLE X-RAY ATOMIC SCATTERING FACTORS MEASURED BY THE CRITICAL VOLTAGE EFFECT IN HIGH-ENERGY ELECTRON-DIFFRACTION [J].
FOX, AG ;
FISHER, RM .
AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (03) :461-468
[9]   EXAMINATION OF GRAPHITE STRUCTURE BY CONVERGENT-BEAM ELECTRON-DIFFRACTION [J].
GOODMAN, P .
ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (SEP1) :793-&
[10]  
HALL S, CRYSTALLOGRAPHY CTR