LINESHAPE MEASUREMENT OF SEMICONDUCTOR-LASERS BELOW THRESHOLD

被引:11
作者
KIKUCHI, K
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关键词
D O I
10.1109/3.7119
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:1814 / 1819
页数:6
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