MAGNETIC-FIELD DEPENDENCE OF HALL RESISTANCE IN THIN-FILMS OF PURE BISMUTH

被引:11
作者
CHU, HT
HENRIKSEN, PN
JING, J
WANG, H
XU, XF
机构
[1] Department of Physics, University of Akron, Akron
来源
PHYSICAL REVIEW B | 1992年 / 45卷 / 19期
关键词
D O I
10.1103/PhysRevB.45.11233
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Hall resistance has been measured in thin films of pure bismuth at 4.2 K in magnetic fields up to about 8 T. Fields were applied parallel to the trigonal axis, which is perpendicular to the plane of the film, and the thicknesses ranged from 30 to 300 nm. In thinner films, the Hall resistance remained in the negative region. In films of intermediate thickness, as the field increased the Hall resistance first decreased, reaching a Minimum in the negative region, then increased to enter the positive region at higher fields. For thicker films, except in a narrow range of low fields, the Hall resistance was positive and increased in magnitude with the field. Superimposed on the general trend of the Hall resistance versus magnetic field, Shubnikov-de Haas-type oscillations have also been observed.
引用
收藏
页码:11233 / 11237
页数:5
相关论文
共 12 条
[1]  
BENGUS SV, 1990, SOV J LOW TEMP PHYS, V16, P790
[2]   INSITU MEASUREMENT OF HALL-EFFECT, MAGNETORESISTANCE, RESISTIVITY, AND TCR OF BISMUTH-FILMS [J].
CHAUDHURI, S ;
PAL, AK .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (08) :3455-3461
[4]   RESISTIVITY AND TRANSVERSE MAGNETORESISTANCE IN ULTRATHIN FILMS OF PURE BISMUTH [J].
CHU, HT ;
HENRIKSEN, PN ;
ALEXANDER, J .
PHYSICAL REVIEW B, 1988, 37 (08) :3900-3905
[5]   ELECTRON-TRANSPORT PHENOMENA IN TWO-DIMENSIONAL THIN-FILMS OF PURE BISMUTH [J].
CHU, HT ;
JI, Y .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1989, 50 (11) :1121-1126
[6]   THICKNESS-DEPENDENT OSCILLATORY BEHAVIOR OF RESISTIVITY AND HALL COEFFICIENT IN THIN SINGLE-CRYSTAL BISMUTH FILMS [J].
DUGGAL, VP ;
RUP, R .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (02) :492-&
[7]   GALVANOMAGNETIC STUDIES OF BISMUTH FILMS IN QUANTUM-SIZE-EFFECT REGION [J].
GARCIA, N ;
STRONGIN, M ;
KAO, YH .
PHYSICAL REVIEW B, 1972, 5 (06) :2029-&
[8]   TEMPERATURE-DEPENDENCE OF RESISTIVITY AND HALL-COEFFICIENT OF THIN BISMUTH FILM [J].
HSU, LS ;
CHANG, YY ;
YOUNG, CS ;
TSENG, PK .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (06) :2359-2363
[9]  
Jing J., UNPUB