LASER ANNEALING OF SILICON-WAFERS AT 10.6 MU-M

被引:3
作者
HAUCK, JP
BEGUWALA, MM
HAYES, CL
PALYS, RF
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1981年 / 64卷 / 01期
关键词
D O I
10.1002/pssa.2210640144
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:407 / 412
页数:6
相关论文
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[6]   LASER ANNEALING OF BORON-IMPLANTED SILICON [J].
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