ATOMIC FORCE MICROSCOPY - A TOOL FOR SURFACE SCIENCE

被引:15
作者
FROMMER, J [1 ]
MEYER, E [1 ]
机构
[1] IBM CORP,ALMADEN RES LAB,SAN JOSE,CA 95114
关键词
D O I
10.1088/0953-8984/3/S/001
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The understanding and manipulation of surfaces have been greatly helped by a variety of atomic force microscopes.
引用
收藏
页码:S1 / S9
页数:9
相关论文
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