ELECTRICAL AND STRUCTURAL-PROPERTIES OF THIN GOLD-FILMS ON GLASS SUBSTRATES

被引:16
作者
HECHT, D [1 ]
STARK, D [1 ]
机构
[1] UNIV DUSSELDORF,INST ANGEW PHYS,D-40225 DUSSELDORF 1,GERMANY
关键词
D O I
10.1016/0040-6090(94)90063-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin gold films of various thicknesses were evaporated onto float glass substrates under ultra-high vacuum conditions and investigated using electrical resistivity measurements as well as scanning tunneling microscopy and spectroscopy. Suitable deposition and annealing parameters minimized the resistivity of the films, and large parts of the surfaces consisted of smooth, close-packed and stepped (111) terraces, at which the conduction electrons could be specularly reflected. Although the mean free path of the conduction electrons exceeded the film thicknesses, the first tunneling spectroscopic data of these films did not show the presence of discrete electronic (standing wave) states (Quantum Size Effect).
引用
收藏
页码:258 / 265
页数:8
相关论文
共 43 条
[11]   COARSE TIP DISTANCE ADJUSTMENT AND POSITIONER FOR A SCANNING TUNNELING MICROSCOPE [J].
FROHN, J ;
WOLF, JF ;
BESOCKE, K ;
TESKE, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (06) :1200-1201
[12]   The conductivity of thin metallic films according to the electron theory of metals [J].
Fuchs, K .
PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108
[13]   SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW LETTERS, 1986, 56 (18) :1972-1975
[14]  
HELLWEGE KH, 1981, LANDOLBORNSTEIN NE A, V13, P20
[15]   SURFACE-ROUGHNESS CONTRIBUTIONS TO THE ELECTRICAL-RESISTIVITY OF POLYCRYSTALLINE METAL-FILMS [J].
JACOB, U ;
VANCEA, J ;
HOFFMANN, H .
PHYSICAL REVIEW B, 1990, 41 (17) :11852-11857
[16]   EXPERIMENTAL STUDY OF QUANTUM SIZE EFFECTS IN THIN METAL-FILMS BY ELECTRON TUNNELING [J].
JAKLEVIC, RC ;
LAMBE, J .
PHYSICAL REVIEW B, 1975, 12 (10) :4146-4160
[17]   THIN-FILM QUANTUM SIZE EFFECTS .1. THE EFFECT OF DEFECT STRUCTURE AT THE VACUUM FILM INTERFACE [J].
JONKER, BT ;
PARK, RL .
SURFACE SCIENCE, 1984, 146 (01) :93-114
[18]   SCANNING TUNNELING MICROSCOPY STUDY OF METALS - SPECTROSCOPY AND TOPOGRAPHY [J].
KAISER, WJ ;
JAKLEVIC, RC .
SURFACE SCIENCE, 1987, 181 (1-2) :55-68
[19]   USE OF A SCANNING TUNNELING MICROSCOPE TO RECTIFY OPTICAL FREQUENCIES AND MEASURE AN OPERATIONAL TUNNELING TIME [J].
LUCAS, AA ;
CUTLER, PH ;
FEUCHTWANG, TE ;
TSONG, TT ;
SULLIVAN, TE ;
YUK, Y ;
NGUYEN, H ;
SILVERMAN, PJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :461-465
[20]   THEORETICAL ASPECTS OF SCANNING TUNNELING MICROSCOPY [J].
LUCAS, AA ;
VIGNERON, JP ;
LAMBIN, P ;
LALOYAUX, T ;
DERYCKE, I .
SURFACE SCIENCE, 1992, 269 :74-80