WAVELENGTH DEPENDENCE OF THE PHOTOABLATION OF CARBON AT LOW IRRADIANCE

被引:2
作者
DWIVEDI, ARK [1 ]
THAREJA, RK [1 ]
机构
[1] INDIAN INST TECHNOL,CTR LASER TECHNOL,KANPUR 208016,UTTAR PRADESH,INDIA
关键词
D O I
10.1063/1.356533
中图分类号
O59 [应用物理学];
学科分类号
摘要
The wavelength dependence of the photoablation of carbon at low irradiance in the presence of helium gas is reported. The vibrational temperature of the molecular species is estimated at various laser wavelengths, laser energies, and helium gas pressures using C2 Swan bands.
引用
收藏
页码:8237 / 8239
页数:3
相关论文
共 20 条
[1]   OPTICAL-EMISSION STUDIES OF MOLECULAR CARBON (C2) [J].
ABHILASHA ;
THAREJA, RK .
PHYSICS LETTERS A, 1993, 184 (01) :99-103
[2]  
ABHILASHA, 1994, THESIS INDIAN I TECH
[3]  
ABHILASHA PSR, 1993, PHYS REV E, V48, P2929
[4]   OPTICAL-EMISSION STUDIES ON GRAPHITE IN A LASER VAPORIZATION SUPERSONIC JET CLUSTER SOURCE [J].
ANSELMENT, M ;
SMITH, RS ;
DAYKIN, E ;
DIMAURO, LF .
CHEMICAL PHYSICS LETTERS, 1987, 134 (05) :444-449
[5]   INSITU GROWTH OF YBACUO SUPERCONDUCTING THIN-FILMS BY EXCIMER-LASER ABLATION - INFLUENCE OF DEPOSITION AND COOLING PARAMETERS [J].
CHAMPEAUX, C ;
MARCHET, P ;
AUBRETON, J ;
MERCURIO, JP ;
CATHERINOT, A .
APPLIED SURFACE SCIENCE, 1993, 69 (1-4) :335-339
[6]   OPTICAL-EMISSION DIAGNOSTICS OF LASER-INDUCED PLASMA FOR DIAMOND-LIKE FILM DEPOSITION [J].
CHEN, X ;
MAZUMDER, J ;
PUROHIT, A .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1991, 52 (05) :328-334
[7]   INTENSITY MEASUREMENTS ON C2 (DPI-3(G)-API-3(U)) SWAN BAND SYSTEM .1. INTERCEPT AND PARTIAL BAND METHODS [J].
DANYLEWYCH, LL ;
NICHOLLS, RW .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1974, 339 (1617) :197-+
[8]   AMORPHIC DIAMOND FILMS PRODUCED BY A LASER PLASMA SOURCE [J].
DAVANLOO, F ;
JUENGERMAN, EM ;
JANDER, DR ;
LEE, TJ ;
COLLINS, CB .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (04) :2081-2087
[9]   CU0, CU+, AND CU-2 FROM EXCIMER-ABLATED COPPER [J].
DREYFUS, RW .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (03) :1721-1729
[10]  
DREYFUS RW, 1986, P SOC PHOTO-OPT INS, V710, P46