QUANTUM-MECHANICAL EFFECTS ON SPUTTER SOURCE ISOTOPE FRACTIONATION

被引:18
作者
NADEAU, MJ
KIESER, WE
BEUKENS, RP
LITHERLAND, AE
机构
关键词
D O I
10.1016/0168-583X(87)90209-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:83 / 86
页数:4
相关论文
共 9 条
[1]  
ARNOLD M, 1986, P WORKSHOP TECHNIQUE
[2]   PROGRESS AT THE ISOTRACE RADIOCARBON FACILITY [J].
BEUKENS, RP ;
GURFINKEL, DM ;
LEE, HW .
RADIOCARBON, 1986, 28 (2A) :229-236
[3]  
KIESER WE, IN PRESS NUCL INSTR
[4]   SECONDARY-ION EMISSION PROBABILITY IN SPUTTERING [J].
NORSKOV, JK ;
LUNDQVIST, BI .
PHYSICAL REVIEW B, 1979, 19 (11) :5661-5665
[6]   MEASUREMENTS OF THE SECONDARY ION MASS-SPECTROMETRY ISOTOPE EFFECT [J].
SCHWARZ, SA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (03) :308-312
[7]   ISOTOPE FRACTIONATION IN SECONDARY ION MASS-SPECTROMETRY [J].
SHIMIZU, N ;
HART, SR .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :1303-1311
[8]   VELOCITY DEPENDENCE OF SECONDARY-ION EMISSION [J].
VASILE, MJ .
PHYSICAL REVIEW B, 1984, 29 (07) :3785-3794