DETECTION LIMIT AND SENSITIVITY IN PIXE ANALYSIS OF THICK SAMPLES

被引：4

作者：

GARTEN, RPH

GROENEVELD, KO

KONIG, KH

SCHADER, J

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1979年 / 26卷 / 01期

关键词：

D O I：

10.1109/TNS.1979.4330391

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Proton induced x-ray emission (PIXE) is a well established tool in trace element analysis of thin samples. Energy loss, self-absorption and reexcitation, however, present serious problems for trace element analysis of thick samples. For a systematic study thick samples have been produced on the basis of synthetic glass with 3 to 5 different lanthanoids of various concentrations. The dependence of detection limit and sensitivity on such parameters as concentration or combination of elements has been investigated. A comparison is given of x-ray spectrometry in different methods (PIXE, scanning electron microscope, electron microprobe). Copyright © 1978 by The Institute of Electrical and Electronics Engineers, Inc.

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页码：1381 / 1383

页数：3

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