COMPARISON OF SEU RATE PREDICTION TECHNIQUES

被引:8
作者
PETERSEN, EL [1 ]
ADAMS, JH [1 ]
机构
[1] USN,RES LAB,GAMMA & COSM RAY ASTRON BRANCH,WASHINGTON,DC 20375
关键词
D O I
10.1109/23.211374
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A variety of methods are in use for predicting upset rates. The predictions of several of these methods are compared with flight data from the microelectronics package on the CRRES satellite. The implications of current cosmic ray research relative to these results is discussed.
引用
收藏
页码:1836 / 1839
页数:4
相关论文
共 18 条
[1]  
ADAMS JH, 1986, NRL5901 MEM REP
[2]  
ADAMS JH, 1991, 22 INT COSM RAY C, V1, P631
[3]  
BADHWAR GD, 1991, 22ND P INT COSM RAY, V1, P643
[4]   COMPARISON OF SOFT ERRORS INDUCED BY HEAVY-IONS AND PROTONS [J].
BISGROVE, JM ;
LYNCH, JE ;
MCNULTY, PJ ;
ABDELKADER, WG ;
KLETNIEKS, V ;
KOLASINSKI, WA .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1571-1576
[5]   SEU FLIGHT DATA FROM THE CRRES MEP [J].
CAMPBELL, AB .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1991, 38 (06) :1647-1654
[6]  
CAMPBELL AB, 1992, IEEE T NUCL SCI, V39
[7]  
GARCIAMUNOZ M, 1987, 20TH P INT COSM RAY, V3, P303
[8]   THE SEU RISK ASSESSMENT OF Z80A, 8086 AND 80C86 MICROPROCESSORS INTENDED FOR USE IN A LOW ALTITUDE POLAR ORBIT [J].
HARBOESORENSEN, R ;
ADAMS, L ;
DALY, EJ ;
SANSOE, C ;
MAPPER, D ;
SANDERSON, TK .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1626-1631
[9]   DEPLETION REGION GEOMETRY ANALYSIS APPLIED TO SINGLE EVENT SENSITIVITY [J].
LANGWORTHY, JB .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (06) :2427-2434
[10]  
LANGWORTHY JB, 1991, NRL6913 MEM REP