PHOTO-EXCITED DLTS - MEASUREMENT OF MINORITY-CARRIER TRAPS

被引：14

作者：

TAKIKAWA, M

IKOMA, T

机构：

来源：

关键词：

D O I：

10.1143/JJAP.19.L436

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L436 / L438

页数：3

共 7 条

[1] DETECTION OF MINORITY-CARRIER TRAPS USING TRANSIENT SPECTROSCOPY [J].

BRUNWIN, R ;

HAMILTON, B ;

JORDAN, P ;

PEAKER, AR .

[2] STUDY OF DEEP LEVELS IN GAAS BY CAPACITANCE SPECTROSCOPY [J].

LANG, DV ;

LOGAN, RA .

LANG, DV .

[4] HOLE TRAPS IN BULK AND EPITAXIAL GAAS CRYSTALS [J].

MITONNEAU, A ;

MARTIN, GM ;

MIRCEA, A .

[5]

MITONNEAU A, 1977, I PHYS C SER A, V33, P73

[6] ELECTRON AND HOLE TRAPS IN N-GAAS CRYSTALS [J].

OKUMURA, T ;

TAKIKAWA, M ;

IKOMA, T .

APPLIED PHYSICS, 1976, 11 (02) :187-189

[7]

SCHOCKLEY W, 1952, PHYS REV, V87, P835