ABSOLUTE REFLECTANCE MEASUREMENT AT NORMAL INCIDENCE

被引：4

作者：

RAM, RS

PRAKASH, O

SINGH, J

VARMA, SP

机构：

[1] The authors are with the Infrared Standard Section, Division of Standard, National Physical Laboratory, New Delhi, 110012, Dr K.S., Krishnan Road

来源：

OPTICS AND LASER TECHNOLOGY | 1990年 / 22卷 / 01期

关键词：

reflectance (absolute); reflectance (normal incidence); reflectometers;

D O I：

10.1016/0030-3992(90)90012-S

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A simple reflectometer for measurement of the absolute reflectance of plane specularly reflecting surfaces at normal incidence without using any reference standard is described. Results obtained for samples of high as well as low-reflecting surfaces using a HeNe laser source are reported. © 1990.

引用

页码：51 / 55

页数：5

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