RESONANT INVERSE-PHOTOEMISSION STUDY OF LAYER-DEPENDENT SURFACE-STATES AT THE EPITAXIAL GAAS(110)-BI INTERFACE

被引:35
作者
MCLEAN, AB
HIMPSEL, FJ
机构
来源
PHYSICAL REVIEW B | 1989年 / 40卷 / 12期
关键词
D O I
10.1103/PhysRevB.40.8425
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:8425 / 8430
页数:6
相关论文
共 31 条
[1]   ELECTRON-STATES OF AN SB-ORDERED OVERLAYER ON GAAS(110) [J].
BERTONI, CM ;
CALANDRA, C ;
MANGHI, F ;
MOLINARI, E .
PHYSICAL REVIEW B, 1983, 27 (02) :1251-1258
[2]   PHOTOEMISSION-BASED PHOTOVOLTAGE PROBE OF SEMICONDUCTOR SURFACE AND INTERFACE ELECTRONIC-STRUCTURE [J].
DEMUTH, JE ;
THOMPSON, WJ ;
DINARDO, NJ ;
IMBIHL, R .
PHYSICAL REVIEW LETTERS, 1986, 56 (13) :1408-1411
[3]   RESONANT INVERSE PHOTOEMISSION VIA PLASMONS [J].
DRUBE, W ;
HIMPSEL, FJ .
PHYSICAL REVIEW LETTERS, 1988, 60 (02) :140-143
[4]   INVERSE OF THE PHOTOELECTRIC EFFECT IN AL [J].
DRUBE, W ;
HIMPSEL, FJ ;
FEIBELMAN, PJ .
PHYSICAL REVIEW LETTERS, 1988, 60 (20) :2070-2073
[5]   UNOCCUPIED SURFACE-STATES OF (1X1) SB OVERLAYERS ON GAAS(110) AND INP(110) [J].
DRUBE, W ;
HIMPSEL, FJ .
PHYSICAL REVIEW B, 1988, 37 (02) :855-857
[6]  
DRUBE W, 1988, 19TH P INT C PHYS SE, P637
[7]  
DRUBE W, UNPUB
[8]   DYNAMICAL ANALYSIS OF LOW-ENERGY ELECTRON-DIFFRACTION INTENSITIES FROM GAAS(110)-P(1X1)-SB(1ML) [J].
DUKE, CB ;
PATON, A ;
FORD, WK ;
KAHN, A ;
CARELLI, J .
PHYSICAL REVIEW B, 1982, 26 (02) :803-814
[9]   FERMI-LEVEL PINNING AT THE SB/GAAS(110) SURFACE STUDIED BY SCANNING TUNNELING SPECTROSCOPY [J].
FEENSTRA, RM ;
MARTENSSON, P .
PHYSICAL REVIEW LETTERS, 1988, 61 (04) :447-450
[10]  
FEENSTRA RM, 1989, MATERIALS RES SOC S, V138, P105