PROCESS CHARACTERIZATION OF JOSEPHSON CIRCUITS

被引：4

作者：

GREINER, JH

KLEPNER, SP

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 18卷 / 02期

关键词：

D O I：

10.1116/1.570738

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：262 / 267

页数：6

共 17 条

[1]

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[2]

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IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (02) :206-211

[4] DAMPED 3-JUNCTION INTERFEROMETERS FOR LATCHING LOGIC [J].

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GREINER, JH ;

HERRELL, DJ ;

KLEPNER, S .

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APPLIED PHYSICS LETTERS, 1978, 33 (08) :781-783

[6] DELAY MEASUREMENT OF EXPERIMENTAL 2.5-MU-M JOSEPHSON CURRENT INJECTION LOGIC (CIL) [J].

GHEEWALA, TR .

APPLIED PHYSICS LETTERS, 1979, 34 (10) :670-672

[7] FABRICATION PROCESS FOR JOSEPHSON INTEGRATED-CIRCUITS [J].

GREINER, JH ;

KIRCHER, CJ ;

KLEPNER, SP ;

LAHIRI, SK ;

WARNECKE, AJ ;

BASAVAIAH, S ;

YEN, ET ;

BAKER, JM ;

BROSIOUS, PR ;

HUANG, HCW ;

MURAKAMI, M ;

AMES, I .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (02) :195-205

[8]

HEBARD AF, 1978, J APPL PHYS, V49, P339

[9] ACCURATE MEASUREMENT OF SMALL INDUCTANCES OR PENETRATION DEPTHS IN SUPERCONDUCTORS [J].

HENKELS, WH .

APPLIED PHYSICS LETTERS, 1978, 32 (12) :829-831

[10] EXPERIMENTAL SINGLE FLUX QUANTUM NDRO JOSEPHSON MEMORY CELL [J].

HENKELS, WH ;

GREINER, JH .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (05) :794-796

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